Development of an Electron beam probing device for beam analysis at the exit of a 90° Electron beam bending system for inside welding
Peter J. Oving, Samuel De Sousa
The quality of EBWelds, realized by a 90° deflected Electron Beam, depends on operator defined parameters of the welding equipment, like gun voltage and current, beam centering, focus current(s), bending magnet current, welding distance and speed. The analysis of the Ebeam at the weld seam position permits beam quality assurance and thereby to maintain constant weld results in time. The small distance between the beam exit and the weld seam position asks for a special analyzer concept without the use of beam deflection. Techmeta’s TechScan (Patented beam analyzer system using a rotating disc scanner) and Techmeta’s TechBend (Patented 90° beam deflection system) have been adapted and associated to generate an instantaneous and undisturbed image of the EBeam current density distribution at the weld seam position. The high scan speed permits the analysis of medium power EBeams with real weld parameters. The probing device has been used to define the parameter set for the inside welding of Niobium half cells at equator and iris position. This paper presents the probing device setup, the operating mode and experimental results.
Cite this article as:
Oving P. J., De Sousa S. Development of an Electron beam probing device for beam analysis at the exit of a 90° Electron beam bending system for inside welding. Electrotechnica & Electronica (Е+Е), Vol. 57 (3-4), 2022, pp.31-35, ISSN: 0861-4717 (Print), 2603-5421 (Online)
